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Author:

Tang Wu (Tang Wu.) | Deng Longjiang (Deng Longjiang.) | Xu Kewei (Xu Kewei.) | Jian Lu (Jian Lu.)

Indexed by:

SCIE EI Scopus CSCD PKU

Abstract:

Au film was fabricated on Al2O3 substrate by magnetron sputtering. The relationship between resistivity of metallic film and its surface roughness, residual stress was investigated according to experimental results. The results show that the resistivity of the metallic film correlates with surface roughness and residual stress. The increase of resistivity with surface roughness and tensile residual stress can be explained by the strain energy theory. It can be inferred that crystal orientation may be connect with the mechanical behavior and functional property of metallic film.

Keyword:

metallic film residual stress resistivity surface roughness

Author Community:

  • [ 1 ] [Tang Wu; Deng Longjiang] Univ Elect Sci & Technol China, State Key Lab Elect Thin Films & Integrated Devic, Chengdu 610054, Peoples R China
  • [ 2 ] [Xu Kewei] Xian Jiaotong Univ, Xian 710049, Peoples R China
  • [ 3 ] [Jian Lu] Univ Technol Troyes, LASMIS, F-10010 Troyes, France

Reprint Author's Address:

  • Univ Elect Sci & Technol China, State Key Lab Elect Thin Films & Integrated Devic, Chengdu 610054, Peoples R China.

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Source :

RARE METAL MATERIALS AND ENGINEERING

ISSN: 1002-185X

Year: 2008

Issue: 4

Volume: 37

Page: 617-620

0 . 1 6 2

JCR@2008

0 . 5 0 6

JCR@2020

ESI Discipline: MATERIALS SCIENCE;

JCR Journal Grade:3

CAS Journal Grade:4

Cited Count:

WoS CC Cited Count: 6

SCOPUS Cited Count:

ESI Highly Cited Papers on the List: 0 Unfold All

WanFang Cited Count:

Chinese Cited Count:

30 Days PV: 15

Affiliated Colleges:

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