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Author:

Long, Jianmin (Long, Jianmin.) | Ding, Yue (Ding, Yue.) | Wang, Gangfeng (Wang, Gangfeng.) (Scholars:王刚锋)

Indexed by:

CPCI-S EI Scopus

Abstract:

When contact radius reduces to micro or nano scale, the influence of surface tension becomes important. In this paper, we summarize some of our works in this subject. Based on the solution of a point force acting on an elastic half space with surface tension, we consider the indentation on an elastic half space by rigid cylinder and sphere, respectively. The explicit relations of load depending on contact radius and indent depth are presented. Through a finite element approach accounting for surface energy, we verify the equivalence of the compression of an elastic sphere and the indentation of a half space, even with the presence of surface tension. Furthermore, we address the influence of surface tension on adhesive contact, and give the explicit expressions of contact radius and indent depth. These works are useful to accurately characterize the contact problems at micro and nano scale. (C) 2017 Published by Elsevier B.V.

Keyword:

adhesion Contact surface energy surface tension

Author Community:

  • [ 1 ] [Long, Jianmin] Hohai Univ, Inst Soft Matter Mech, Coll Mech & Mat, Nanjing 210098, Jiangsu, Peoples R China
  • [ 2 ] [Ding, Yue; Wang, Gangfeng] Xi An Jiao Tong Univ, Dept Engn Mech, SVL, Xian 710049, Shaanxi, Peoples R China
  • [ 3 ] [Long, Jianmin]Hohai Univ, Inst Soft Matter Mech, Coll Mech & Mat, Nanjing 210098, Jiangsu, Peoples R China
  • [ 4 ] [Ding, Yue]Xi An Jiao Tong Univ, Dept Engn Mech, SVL, Xian 710049, Shaanxi, Peoples R China
  • [ 5 ] [Wang, Gangfeng]Xi An Jiao Tong Univ, Dept Engn Mech, SVL, Xian 710049, Shaanxi, Peoples R China

Reprint Author's Address:

  • 王刚锋

    Xi An Jiao Tong Univ, Dept Engn Mech, SVL, Xian 710049, Shaanxi, Peoples R China.

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Source :

2016 IUTAM SYMPOSIUM ON NANOSCALE PHYSICAL MECHANICS

ISSN: 2210-9838

Year: 2017

Volume: 21

Page: 40-47

Language: English

Cited Count:

WoS CC Cited Count: 6

SCOPUS Cited Count: 10

ESI Highly Cited Papers on the List: 0 Unfold All

WanFang Cited Count:

Chinese Cited Count:

30 Days PV: 3

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