We　present　a　simulation　study　on　the　peeling　of　carbon　nanotubes　bundles　interacting　with　a　flat　substrate,　represented　by　the　back　surface　of　an　atomic　force　microscopy　cantilever.　A　defected　sample,　acquired　in　situ　using　a　scanning　electron　microscope,　was　investigated　under　different　peeling　configurations　by　finite　element　method　simulations.　The　coupled　computational-experimental　analysis　let　to　identify　the　position　and　the　entity　of　a　structural　defect　by　means　of　reverse　image　correlation　problem.　By　exploiting　this　defective　fiber　it　was　also　possible　to　quantify,　as　indirect　measure,　the　friction　and　adhesion　forces　between　the　bundle　and　the　substrate　of　few　pN　magnitude,　otherwise　difficult　to　measure　with　the　resolution　of　currently　available　instruments.　The　proposed　approach　can　be　useful　to　study　the　tribology-induced　mechanical　behavior　of　one-dimensional　nanostructures　as　well　as　for　real-time　identification　and　monitoring　of　nanodefects　for　industrial　applications,　such　as　nanoelectronics.