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Author:

Li, Zhen (Li, Zhen.) | Wang, Weiwang (Wang, Weiwang.) | Li, Shengtao (Li, Shengtao.) (Scholars:李盛涛) | Min, Daomin (Min, Daomin.) | Chen, Linshan (Chen, Linshan.) | Li, Xiyu (Li, Xiyu.)

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Abstract:

Breakdown and surface flashover are likely to occur on silicone rubber in the complex operation environments of electrical system. Firstly, silicone rubber specimens were treated by ultraviolet irradiation in vacuum for 24 hours, and DC breakdown and surface flashover characteristics of treated and untreated specimens were tested. Then, the activation energy and relaxation time distribution were calculated by dielectric relaxation spectroscopy. The trap characteristics were analyzed by surface potential decay. Finally, the chemical reaction of silicone rubber molecular chains was characterized using infrared spectroscopy. The results indicate that the molecular chains of silicone rubber crosslink via ultraviolet irradiation in vacuum, the activation energy of dipolar orientation polarization increases, while the molecular chain relaxation time decreases and molecular chain dynamic is hindered, which can improve the trap level and suppress the charge transport process of silicone rubber. DC breakdown strength and surface flashover voltage will increase by 2.38% and 8.79%, respectively. The molecular chain dynamic and charge transport process of silicone rubber, which is irradiated by ultraviolet in vacuum of which pressure is lower than 5×10-4 Pa for 24 h, are suppressed, thus the DC breakdown and surface flashover characteristics will be enhanced efficiently. The results can provide references for solving breakdown and surface flashover in silicone rubbers. © 2019, High Voltage Engineering Editorial Department of CEPRI. All right reserved.

Keyword:

Activation energy Crosslinking Dielectric properties Dielectric relaxation Electric insulators Flashover Infrared spectroscopy Irradiation Molecular orientation Relaxation time Rubber Silicone rubber Silicones

Author Community:

  • [ 1 ] [Li, Zhen]School of Electrical Engineering, Xi'an Jiaotong University, Xi'an; 710049, China
  • [ 2 ] [Wang, Weiwang]School of Electrical Engineering, Xi'an Jiaotong University, Xi'an; 710049, China
  • [ 3 ] [Li, Shengtao]School of Electrical Engineering, Xi'an Jiaotong University, Xi'an; 710049, China
  • [ 4 ] [Min, Daomin]School of Electrical Engineering, Xi'an Jiaotong University, Xi'an; 710049, China
  • [ 5 ] [Chen, Linshan]Xi'an XD High Voltage Bushing Co., Ltd., Xi'an; 712044, China
  • [ 6 ] [Li, Xiyu]Technical Research Center, Xi'an Electric Research Institute Co., Ltd., Xi'an; 710077, China

Reprint Author's Address:

  • [Wang, Weiwang]School of Electrical Engineering, Xi'an Jiaotong University, Xi'an; 710049, China;;

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Source :

Gaodianya Jishu/High Voltage Engineering

ISSN: 1003-6520

Year: 2019

Issue: 9

Volume: 45

Page: 2919-2927

Cited Count:

WoS CC Cited Count: 0

SCOPUS Cited Count: 6

ESI Highly Cited Papers on the List: 0 Unfold All

WanFang Cited Count:

Chinese Cited Count:

30 Days PV: 3

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