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Author:

Pan, Tongyang (Pan, Tongyang.) | Chen, Jinglong (Chen, Jinglong.) | Zhang, Tianci (Zhang, Tianci.) | Liu, Shen (Liu, Shen.) | He, Shuilong (He, Shuilong.) | Lv, Haixin (Lv, Haixin.)

Indexed by:

EI Scopus SCIE Engineering Village

Abstract:

Intelligent fault diagnosis has been a promising way for condition-based maintenance. However, the small sample problem has limited the application of intelligent fault diagnosis into real industrial manufacturing. Recently, the generative adversarial network (GAN) is considered as a promising way to solve the problem of small sample. For this purpose, this paper reviews the related research results on small-sample-focused fault diagnosis methods using the GAN. First, a systematic description of the GAN, and its variants, including structure-focused and loss-focused improvements, are introduced in the paper. Second, the paper reviews the related GAN-based intelligent fault diagnosis methods and classifies these studies into three main categories, deep generative adversarial networks for data augmentation, adversarial training for transfer learning, and other application scenarios (including GAN for anomaly detection and semi-supervised adversarial learning). Finally, the paper discusses several limitations of existing studies and points out future perspectives of GAN-based applications. © 2021 ISA

Keyword:

Anomaly detection Deep learning Failure analysis Fault detection Generative adversarial networks

Author Community:

  • [ 1 ] [Pan, Tongyang]State Key Laboratory for Manufacturing and Systems Engineering, Xi'an Jiaotong University, Xi'an; 710049, China
  • [ 2 ] [Chen, Jinglong]State Key Laboratory for Manufacturing and Systems Engineering, Xi'an Jiaotong University, Xi'an; 710049, China
  • [ 3 ] [Zhang, Tianci]State Key Laboratory for Manufacturing and Systems Engineering, Xi'an Jiaotong University, Xi'an; 710049, China
  • [ 4 ] [Liu, Shen]State Key Laboratory for Manufacturing and Systems Engineering, Xi'an Jiaotong University, Xi'an; 710049, China
  • [ 5 ] [He, Shuilong]School of Mechanical and Electrical Engineering, Guilin University of Electronic Technology, Guilin; 541004, China
  • [ 6 ] [Lv, Haixin]State Key Laboratory for Manufacturing and Systems Engineering, Xi'an Jiaotong University, Xi'an; 710049, China
  • [ 7 ] [Pan, Tongyang]Xi An Jiao Tong Univ, State Key Lab Mfg & Syst Engn, Xian 710049, Peoples R China
  • [ 8 ] [Chen, Jinglong]Xi An Jiao Tong Univ, State Key Lab Mfg & Syst Engn, Xian 710049, Peoples R China
  • [ 9 ] [Zhang, Tianci]Xi An Jiao Tong Univ, State Key Lab Mfg & Syst Engn, Xian 710049, Peoples R China
  • [ 10 ] [Liu, Shen]Xi An Jiao Tong Univ, State Key Lab Mfg & Syst Engn, Xian 710049, Peoples R China
  • [ 11 ] [Lv, Haixin]Xi An Jiao Tong Univ, State Key Lab Mfg & Syst Engn, Xian 710049, Peoples R China
  • [ 12 ] [He, Shuilong]Guilin Univ Elect Technol, Sch Mech & Elect Engn, Guilin 541004, Peoples R China

Reprint Author's Address:

  • [Chen, J.]State Key Laboratory for Manufacturing and Systems Engineering, China;;

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Source :

ISA Transactions

ISSN: 0019-0578

Year: 2022

Volume: 128

Page: 1-10

5 . 4 6 8

JCR@2020

ESI Discipline: ENGINEERING;

ESI HC Threshold:7

Cited Count:

WoS CC Cited Count:

SCOPUS Cited Count: 88

ESI Highly Cited Papers on the List: 0 Unfold All

WanFang Cited Count:

Chinese Cited Count:

30 Days PV: 4

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