The　J-integral　analysis　is　performed　for　the　plane　problems　of　multiple　subinterface　microcracks　near　the　tip　of　an　interface　macrocrack　in　bimaterial　solids.　The　analysis　starts　from　a　general　solution　based　on　the　＇＇pseudo-traction＇＇　method　which　has　been　addressed　thoroughly　in　homogeneous　cases.　The　contribution　to　the　J-integral　induced　from　the　subinterface　microcracks　is　shown　in　a　consistent　relation　with　those　induced　from　an　interface　macrocrack　tip　and　the　remote　stress　field.　A　new　technique　is　developed　to　evaluate　the　second　component　(being　expressed　by　J(2)*　in　this　paper)　of　the　well-known　J(k)-vector　of　a　subinterface　crack　for　considering　a　contour　enclosing　the　whole　crack,　which　is　necessary　to　evaluate　the　contribution　to　the　J-integral　arising　from　the　subinterface　microcracks.　The　consistency　of　the　J-integral　for　numerical　examples　is　proved,　where　two　kinds　of　material　combinations　presented　by　Hutchinson　et　al.　[ASME　J.　Appl.　Mech.,　1987,　54,　828-832]　are　considered.　Some　discussion　and　conclusions　are　then　given　which　seem　very　useful　in　the　investigation　of　microcrack　shielding　problems　in　bimaterial　cases.　(C)　1997　Elsevier　Science　Ltd.