This　paper　investigates　the　buckling　behavior　of　piezoelectric　nanowires　under　distributed　transverse　loading,　within　the　framework　of　the　Timoshenko　beam　theory,　and　in　the　presence　of　surface　effects.　Analytical　relations　are　given　for　the　critical　force　of　axial　buckling　of　nanowires　by　accounting　for　the　effects　of　surface　elasticity,　residual　surface　tension,　and　transverse　shear　deformation.　Through　an　example,　it　is　shown　that　the　critical　electric　potential　of　buckling　depends　on　both　the　surface　stresses　and　piezoelectricity.　This　study　may　be　helpful　in　the　characterization　of　the　mechanical　properties　of　nanowires　and　in　the　calibration　of　the　nanowire-based　force　sensors.